发明名称 METHOD FOR MANUFACTURING THIN FILM TRANSISTOR, SEMICONDUCTOR DEVICE, ELECTRO-OPTICAL DEVICE, AND ELECTRONIC APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a TFT or the like wherein an LDD structure can be formed by dopant implantation process of one time. SOLUTION: A process is contained wherein a gate electrode 20 having a slope in which film thickness becomes large gradually from an end in a channel lengthwise direction toward a central part is formed on a gate insulating film. Implantation of dopant element such as Phosphorus is performed by using the gate electrode 20 as a mask, a heavily doped n<SP>+</SP>-type region 22a as a source/drain region, a lightly doped n<SP>-</SP>-type region 22b and a channel region 24 which are shown in Fig. (B) are formed finally. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006019505(A) 申请公布日期 2006.01.19
申请号 JP20040195776 申请日期 2004.07.01
申请人 SEIKO EPSON CORP 发明人 YUDASAKA KAZUO
分类号 H01L21/336;H01L29/41;H01L29/417;H01L29/786 主分类号 H01L21/336
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