发明名称 |
METHOD FOR MANUFACTURING THIN FILM TRANSISTOR, SEMICONDUCTOR DEVICE, ELECTRO-OPTICAL DEVICE, AND ELECTRONIC APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for manufacturing a TFT or the like wherein an LDD structure can be formed by dopant implantation process of one time. SOLUTION: A process is contained wherein a gate electrode 20 having a slope in which film thickness becomes large gradually from an end in a channel lengthwise direction toward a central part is formed on a gate insulating film. Implantation of dopant element such as Phosphorus is performed by using the gate electrode 20 as a mask, a heavily doped n<SP>+</SP>-type region 22a as a source/drain region, a lightly doped n<SP>-</SP>-type region 22b and a channel region 24 which are shown in Fig. (B) are formed finally. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006019505(A) |
申请公布日期 |
2006.01.19 |
申请号 |
JP20040195776 |
申请日期 |
2004.07.01 |
申请人 |
SEIKO EPSON CORP |
发明人 |
YUDASAKA KAZUO |
分类号 |
H01L21/336;H01L29/41;H01L29/417;H01L29/786 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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