发明名称 |
POSITIVE RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a positive resist composition with a wide DOF (depth of focus) and a method for forming a resist pattern. <P>SOLUTION: The positive resist composition contains (A) a resin component the alkali solubility of which increases by an effect of an acid and (B) an acid generating agent component which generates an acid by exposure. The component (A) is a copolymer comprising n (n is an integer 4 to 6) kinds of structural units having different structures from one another, wherein the proportion of each structural unit in the copolymer is over 0 mol% to 100/(n-1) mol% or lower. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006018071(A) |
申请公布日期 |
2006.01.19 |
申请号 |
JP20040196567 |
申请日期 |
2004.07.02 |
申请人 |
TOKYO OHKA KOGYO CO LTD |
发明人 |
HAYASHI RYOTARO;YAMADA SATOSHI;IRIE MAKIKO |
分类号 |
G03F7/039;C08F220/00;G03F7/033;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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