发明名称
摘要 <p>A semiconductor device having a first semiconductor element placed over a second semiconductor element, so that an edge of the first semiconductor element is not placed over a predetermined circuit in the second semiconductor element, and wherein a size of the first semiconductor element is smaller than a size of the second semiconductor element. The predetermined circuit has a characteristic that tends to change with stress greater than characteristics of other circuits on the second semiconductor element that are under the edge of the first semiconductor element.</p>
申请公布号 JP3737333(B2) 申请公布日期 2006.01.18
申请号 JP20000075833 申请日期 2000.03.17
申请人 发明人
分类号 H01L25/18;H01L23/495;H01L25/065;H01L25/07 主分类号 H01L25/18
代理机构 代理人
主权项
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