发明名称 DEFECT CAUSE INVESTIGATING SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a system and a method which efficiently investigates the cause of a defect occurred in continuously processing a plurality of products, using a cheap apparatus. <P>SOLUTION: The system temporarily saves continuous images obtained by high speed photographing of a processing operation, photographs a processed product, compares the photographed product image with a previously recognized non-defective product image to decide the existence of any defect, successively saves the temporary saved continuous images for investigating the cause of a defect if found, or may erase the continuous images if any defect is not found, thus enabling the successive acquisition of continuous images with a limited memory capacity. A condition photographing camera 21 takes images during processing; an inspective camera 23 takes images after processing; and a controller 25 decides the existence of any defect, decides whether the images are saved or erased, and controls the entire system. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006013120(A) 申请公布日期 2006.01.12
申请号 JP20040187669 申请日期 2004.06.25
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 NAKANO TOMOYUKI;KAWAGUCHI TERUO;ISHITANI YASUYUKI;SASAKI MASARU;OKA SUSUMU
分类号 H05K13/08 主分类号 H05K13/08
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