发明名称 METHOD FOR PRODUCING MARKER ON SUBSTRATE, LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a method and an apparatus which enables more accurate alignment in a smaller time. <P>SOLUTION: The method of producing a marker (11) on a substrate (W) includes projecting a patterned beam on a layer (R) of resist disposed on the substrate (W) in a lithographic apparatus to create a latent marker (10); and locally heating the substrate (W) at the marker location in the lithographic apparatus to transform the latent marker (10) into a detectable marker (11). <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006013528(A) 申请公布日期 2006.01.12
申请号 JP20050213413 申请日期 2005.06.24
申请人 ASML NETHERLANDS BV 发明人 VAN DER SCHAAR MAURITS;BURGHOORN JACOBUS;VAN HAREN RICHARD JOHANNES FRANCISCUS;MONSHOUWER RENE;MOS EVERHARDUS CORNELIS
分类号 H01L21/027;G03F9/00 主分类号 H01L21/027
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