发明名称 |
METHOD FOR PRODUCING MARKER ON SUBSTRATE, LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method and an apparatus which enables more accurate alignment in a smaller time. <P>SOLUTION: The method of producing a marker (11) on a substrate (W) includes projecting a patterned beam on a layer (R) of resist disposed on the substrate (W) in a lithographic apparatus to create a latent marker (10); and locally heating the substrate (W) at the marker location in the lithographic apparatus to transform the latent marker (10) into a detectable marker (11). <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006013528(A) |
申请公布日期 |
2006.01.12 |
申请号 |
JP20050213413 |
申请日期 |
2005.06.24 |
申请人 |
ASML NETHERLANDS BV |
发明人 |
VAN DER SCHAAR MAURITS;BURGHOORN JACOBUS;VAN HAREN RICHARD JOHANNES FRANCISCUS;MONSHOUWER RENE;MOS EVERHARDUS CORNELIS |
分类号 |
H01L21/027;G03F9/00 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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