发明名称 |
X-RAY INSPECTING METHOD AND X-RAY INSPECTING DEVICE |
摘要 |
<p>An X-ray inspecting method comprising the steps of setting the tube voltage of an X-ray tube to one that sets the difference in X-ray absorptance between a first X-ray propagating medium and a second X-ray propagating medium different in X-ray absorption power from the first X-ray propagating medium in a subject to 10% or smaller, applying an X-ray beam to the subject from the X-ray tube while being set to the above tube voltage, and detecting a transmission X-ray image having an X-ray refraction image formed, superposed on an X-ray absorption image reflecting the difference in X-ray absorption power between the first X-ray propagating medium and the second X-ray propagating medium, by the X-ray beam refraction at the interface surface between the first X-ray propagating medium and the second X-ray propagating medium in an area along the outline of the interface surface.</p> |
申请公布号 |
WO2006004185(A1) |
申请公布日期 |
2006.01.12 |
申请号 |
WO2005JP12602 |
申请日期 |
2005.07.07 |
申请人 |
KABUSHIKI KAISHA TOSHIBA;TOSHIBA ELECTRON TUBES & DEVICES CO., LTD.;ANNO, HIDERO |
发明人 |
ANNO, HIDERO |
分类号 |
(IPC1-7):A61B6/00;G01N23/04 |
主分类号 |
(IPC1-7):A61B6/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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