发明名称 X-RAY INSPECTING METHOD AND X-RAY INSPECTING DEVICE
摘要 <p>An X-ray inspecting method comprising the steps of setting the tube voltage of an X-ray tube to one that sets the difference in X-ray absorptance between a first X-ray propagating medium and a second X-ray propagating medium different in X-ray absorption power from the first X-ray propagating medium in a subject to 10% or smaller, applying an X-ray beam to the subject from the X-ray tube while being set to the above tube voltage, and detecting a transmission X-ray image having an X-ray refraction image formed, superposed on an X-ray absorption image reflecting the difference in X-ray absorption power between the first X-ray propagating medium and the second X-ray propagating medium, by the X-ray beam refraction at the interface surface between the first X-ray propagating medium and the second X-ray propagating medium in an area along the outline of the interface surface.</p>
申请公布号 WO2006004185(A1) 申请公布日期 2006.01.12
申请号 WO2005JP12602 申请日期 2005.07.07
申请人 KABUSHIKI KAISHA TOSHIBA;TOSHIBA ELECTRON TUBES & DEVICES CO., LTD.;ANNO, HIDERO 发明人 ANNO, HIDERO
分类号 (IPC1-7):A61B6/00;G01N23/04 主分类号 (IPC1-7):A61B6/00
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