发明名称 TEMPERATURE CONTROL MECHANISM ON A MEMORY DEVICE
摘要 <p>In one embodiment, a method for determining when an operating temperature of an electronic component (e.g. a memory device) is above a threshold temprature is provided. The method comprises periodically charging a capacitor mounted on an electronic component; initializing a timer to count down from a counter value, once the capacitor is charged; determining if the capacitor has discharged before the timer has counted down to zero; and if the capacitor has discharged before the timer has counted down to zero then generating an interrupt.</p>
申请公布号 WO2006004676(A1) 申请公布日期 2006.01.12
申请号 WO2005US22770 申请日期 2005.06.24
申请人 INTEL CORPORATION;JAIN, SANDEEP, K.;MISHRA, ANIMESH 发明人 JAIN, SANDEEP, K.;MISHRA, ANIMESH
分类号 G01K7/34;H01L23/34;(IPC1-7):G01K7/34 主分类号 G01K7/34
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