发明名称 EXPOSURE APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor exposure apparatus capable of reducing adverse influence of thermal strain by minimizing the temperature difference between a refrigerant entrance and a refrigerant exit of a heat generating body against the heating value of the heat generating body, and further improving follow-up performance. <P>SOLUTION: The semiconductor exposure apparatus is equipped with a means of performing temperature control so that the refrigerant entrance temperature of the heat generating body is always constant, a means for detecting the refrigerant exit temperature of the heat generating body, and a means for adjusting the refrigerant flow rate to keep the refrigerant exit temperature of the heat generating body within a certain fixed range, and is controlled to make the temperature difference between the refrigerant entrance and exit constant. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006013212(A) 申请公布日期 2006.01.12
申请号 JP20040189647 申请日期 2004.06.28
申请人 CANON INC 发明人 NOMOTO MAKOTO
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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