发明名称 Stencil mask, charged particle irradiation apparatus and the method
摘要 A stencil mask capable of attaining long durability without any special processing thereon, wherein an inversion means for inverting the front and back of the stencil mask formed with an opening pattern penetrating in the thickness direction is provided, so that positions can be changed, that is, a surface irradiated with charged particles can be on the side of facing to a substrate subjected to processing, and a surface faced to the substrate can be on the side of receiving irradiation of charged particles, and the inversion means comprises a mask holder for electrostatically sticking with an outer circumferential part of the stencil mask and a rotation means for rotating the mask holder about an axis of a supporting portion.
申请公布号 EP1505438(A3) 申请公布日期 2006.01.11
申请号 EP20040017540 申请日期 2004.07.23
申请人 SONY CORPORATION;KABUSHIKI KAISHA TOSHIBA;ULVAC, INC. 发明人 TOMOYUKI, OSADA;SHIBATA, TAKESHI;NISHIHASHI, TSUTOMU
分类号 H01L21/265;G03F1/20;G03F1/68;G03F7/20;H01J37/09;H01J37/317;H01L21/027 主分类号 H01L21/265
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