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发明名称
SEMICONDUCTOR DEVICE HAVING TEST ELEMENT GROUP
摘要
申请公布号
KR20060001714(A)
申请公布日期
2006.01.06
申请号
KR20040050871
申请日期
2004.06.30
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
CHANG, SEUNG HYUN;KIM, SUNG JIN;LEE, JAE PIL;KIM, TAE HEON;CHOI, JIN WOO;MIN, EUN YOUNG;NAM, KI HEUM
分类号
H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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