发明名称 Salicide process using bi-metal layer and method of fabricating semiconductor device using the same
摘要 A salicide process using a bi-metal layer and method of fabricating a semiconductor substrate using the same are disclosed herein. The salicide process includes forming a main metal layer on a semiconductor substrate containing silicon. A main metal alloy layer containing at least one species of alloy element is formed on the main metal layer. The semiconductor substrate having the main metal layer and the main metal alloy layer is annealed to form a main metal alloy silicide layer. According to an exemplary embodiment of the present invention, the main metal layer may be formed of a nickel (Ni) layer, and the main metal alloy layer may be formed of a nickel tantalum alloy layer. In this case, a nickel tantalum silicide layer having improved thermal stability and electrical characteristics are formed.
申请公布号 US2006003534(A1) 申请公布日期 2006.01.05
申请号 US20050147633 申请日期 2005.06.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 ROH KWAN-JONG;SUN MIN-CHUL;KU JA-HUM;JUNG SUG-WOO;KIM MIN-JOO;HAN SUNG-KEE
分类号 H01L21/24;H01L21/336;H01L21/28;H01L21/285;H01L29/49 主分类号 H01L21/24
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