| 摘要 |
PROBLEM TO BE SOLVED: To provide an evaluation method capable of evaluating easily an marked element or parameter, capable of obtaining an accurate result, and capable of the result quickly. SOLUTION: A plurality of evaluation circuits is formed in the same substrate, and the plurality of evaluation circuits is operated at the same time to evaluate properly an output of the one evaluation circuit selected by a selection circuit formed on the substrate. COPYRIGHT: (C)2006,JPO&NCIPI
|
