发明名称 Stressed semiconductor device structures having granular semiconductor material
摘要 A method of fabricating a semiconductor device structure, includes: providing a substrate, providing an electrode on the substrate, forming a recess in the electrode, the recess having an opening, disposing a small grain semiconductor material within the recess, covering the opening to contain the small grain semiconductor material, within the recess, and then annealing the resultant structure.
申请公布号 WO2005050701(A3) 申请公布日期 2006.01.05
申请号 WO2004US37434 申请日期 2004.11.09
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;DORIC, BRUCE, B.;BELYANSKY, MICHAEL, P.;BOYD, DIANE, C.;CHIDAMBARRAO, DURESETI;GLUSCHENKOV, OLEG 发明人 DORIS, BRUCE, B.;BELYANSKY, MICHAEL, P.;BOYD, DIANE, C.;CHIDAMBARRAO, DUSRETI;GLUSCHENKOV, OLEG
分类号 H01L21/8238 主分类号 H01L21/8238
代理机构 代理人
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