发明名称
摘要 PROBLEM TO BE SOLVED: To provide a capacitor utilizing a highly-oriented ferroelectric crystalline thin film that is grown reproducibly, and a semiconductor device therewith. SOLUTION: A capacitor consists of a lower electrode 13 having a (111) oriented crystalline structure, a ferroelectric material thin film 12 consisting of crystalline grains aligned to form a stacking layered structure, and an upper electrode 11, wherein more than 80% of the stacking orientation (c axis) of the single-crystalline cells of the crystalline grains lie in the direction 54.7 deg. (or 35.3 deg.) from the interface with the lower electrode 13. Such a ferroelectric material thin film 12 can be grown reproducibly with an epitaxial growth method. A semiconductor device, such as an FeRAM(ferroelectric random access memory), is obtained using the capacitor stated above.
申请公布号 JP3732631(B2) 申请公布日期 2006.01.05
申请号 JP19970263713 申请日期 1997.09.29
申请人 发明人
分类号 H01L27/105;G11C11/22;H01L21/8242;H01L21/8246;H01L21/8247;H01L27/10;H01L27/108;H01L29/788;H01L29/792 主分类号 H01L27/105
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