| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit capable of setting the optimum voltage in response to an operation characteristic in every chip and an operation characteristic in the present operation condition so as to preclude a processor from being brought into an abnormal operation such as a hung-up when fluctuating dynamically an operation voltage of the processor. <P>SOLUTION: This semiconductor integrated circuit includes a core circuit operated based on a clock signal to execute a command, a voltage control part for changing an electric power source voltage supplied to the core circuit, a clock generating part for supplying the clock signal to the core circuit, and a test circuit operated by the clock signal and the power source voltage to test whether the core circuit is operated normally by the power source voltage or not, by simulating the the operation of the core circuit. The clock generating part supplies another signal to the core circuit in stead of the clock signal during changing the power source voltage by the voltage control part. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p> |
