发明名称 METHOD AND APPARATUS FOR CLEANING, PLATED SUBSTRATE TO BE TREATED
摘要 PROBLEM TO BE SOLVED: To provide a method and an apparatus which clean a plating liquid still adhered on the surface of a plated substrate to be treated over the whole surface of the substrate to be treated with a uniformly cleaning capacity. SOLUTION: A wafer holder 104 holding, and vertically moving, a wafer 103 is installed at the lower side of a plating device. A cleaning apparatus 1 is installed with three nozzles of 1A, 1B, 1C vertically placed beside a space in which the wafer holder 104 moves vertically. Flat-spray nozzles are used for the middle stage nozzle 1B and the highest stage nozzle 1C, and a slit-type nozzle for the lowest stage nozzle 1A. The respective nozzles supply cleaning liquid to different parts on the surface of the wafer. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006000809(A) 申请公布日期 2006.01.05
申请号 JP20040182389 申请日期 2004.06.21
申请人 TDK CORP 发明人 SOTOZONO TAKEHIKO;ISOBE MITSUHARU;YODA TAKURO;ASAHARA HIDEKI
分类号 B08B3/02;C25D17/00;H01L21/304 主分类号 B08B3/02
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