发明名称 |
METHOD OF ESTIMATING REFLECTANCE FUNCTION OF SCENE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method and a system which estimate a reflectance function of an arbitrary scene. SOLUTION: A scene is illuminated under various lighting conditions. One illumination image and one observed image are associated with each illumination condition. A plurality of non-overlapping kernels are determined for each pixel in a reflectance image from pairs of illumination and observed images. A weight is then determined for each kernel to estimate a reflectance function represented as the reflectance image. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006004432(A) |
申请公布日期 |
2006.01.05 |
申请号 |
JP20050175493 |
申请日期 |
2005.06.15 |
申请人 |
MITSUBISHI ELECTRIC RESEARCH LABORATORIES INC |
发明人 |
PFISTER HANSPETER;MATUSIK WOJCIECH;LOPER MATTHEW M |
分类号 |
G06T15/50;G06T1/00;G06T7/40;H04N1/407 |
主分类号 |
G06T15/50 |
代理机构 |
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