发明名称 METHOD OF ESTIMATING REFLECTANCE FUNCTION OF SCENE
摘要 PROBLEM TO BE SOLVED: To provide a method and a system which estimate a reflectance function of an arbitrary scene. SOLUTION: A scene is illuminated under various lighting conditions. One illumination image and one observed image are associated with each illumination condition. A plurality of non-overlapping kernels are determined for each pixel in a reflectance image from pairs of illumination and observed images. A weight is then determined for each kernel to estimate a reflectance function represented as the reflectance image. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006004432(A) 申请公布日期 2006.01.05
申请号 JP20050175493 申请日期 2005.06.15
申请人 MITSUBISHI ELECTRIC RESEARCH LABORATORIES INC 发明人 PFISTER HANSPETER;MATUSIK WOJCIECH;LOPER MATTHEW M
分类号 G06T15/50;G06T1/00;G06T7/40;H04N1/407 主分类号 G06T15/50
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