发明名称 Method of fabricating semiconductor device
摘要 Method of fabricating thin-film transistors in which contact with connecting electrodes becomes reliable. When contact holes are formed, the bottom insulating layer is subjected to a wet etching process, thus producing undercuttings inside the contact holes. In order to remove the undercuttings, a light etching process is carried out to widen the contact holes. Thus, tapering section are obtained, and the covering of connection wiring is improved.
申请公布号 US2005287722(A1) 申请公布日期 2005.12.29
申请号 US20050211694 申请日期 2005.08.26
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD., A JAPAN CORPORATION 发明人 ZHANG HONGYONG
分类号 H01L21/84;H01L21/311;H01L21/336;H01L21/768;(IPC1-7):H01L21/00 主分类号 H01L21/84
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