发明名称 Immersion photolithography system and method using inverted wafer-projection optics interface
摘要 A liquid immersion photolithography system includes an exposure system that exposes a substrate with electromagnetic radiation, and also includes a projection optical system that focuses the electromagnetic radiation on the substrate. A liquid supply system provides a liquid between the projection optical system and the substrate. The projection optical system is positioned below the substrate.
申请公布号 US6980277(B2) 申请公布日期 2005.12.27
申请号 US20040831300 申请日期 2004.04.26
申请人 ASML HOLDING N.V. 发明人 SEWELL HARRY
分类号 G02B13/14;G03B27/42;G03F7/20;H01L21/027;(IPC1-7):G03B27/52;G02B21/02 主分类号 G02B13/14
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