发明名称 Method for manufacturing a semiconductor device having polysilicon plugs
摘要 A method for manufacturing a DRAM device on a silicon substrate includes: forming cell transistors in a memory cell area and other transistors in a peripheral circuit area; forming polysilicon plugs connected to diffused regions of the cell transistors and metallic plugs connected to diffused regions of the other transistors; heat treating at a temperature of 980 to 1,020 degrees C.; heat treating at a temperature of 700 to 850 degrees C.; implanting fluorine or boron fluoride into the diffused regions of the other transistors; and heat treating at a temperature of 500 to 850 degrees C.
申请公布号 US2005282335(A1) 申请公布日期 2005.12.22
申请号 US20050153321 申请日期 2005.06.16
申请人 ELPIDA MEMORY, INC. 发明人 OKONOGI KENSUKE;OHYU KIYONORI;MANABE KAZUTAKA;YAMADA SATORU;OHASHI TAKUO
分类号 H01L21/265;H01L21/285;H01L21/324;H01L21/336;H01L21/768;H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/265
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