发明名称 Semiconductor storage device, manufacturing method therefor and portable electronic equipment
摘要 A semiconductor storage device has a single gate electrode formed on a semiconductor substrate through a gate insulation film. First and second memory function bodies formed on both sides of the gate electrode. A P-type channel region is formed in a surface of the substrate on the side of the gate electrode. N-type first and second diffusion regions are formed on both sides of the channel region. The channel region is composed of an offset region located under the first and second memory function bodies and a gate electrode beneath region located under the gate electrode. The concentration of a dopant which imparts a P-type conductivity to the offset region is effectively lower than the concentration of a dopant which imparts the P-type conductivity to the gate electrode beneath region. This makes it possible to provide the semiconductor storage device which is easily shrunk in scale.
申请公布号 US2005280065(A1) 申请公布日期 2005.12.22
申请号 US20050142770 申请日期 2005.06.02
申请人 SHARP KABUSHIKI KAISHA 发明人 IWATA HIROSHI;SHIBATA AKIHIDE;KATAOKA KOTARO;NAKANO MASAYUKI
分类号 G11C16/04;H01L21/28;H01L21/336;H01L21/84;H01L27/108;H01L27/12;H01L29/792;(IPC1-7):H01L27/108 主分类号 G11C16/04
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