| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing device of an A/D converter which measures nonlinear errors with high precise and substantially eliminates data processing time. SOLUTION: The testing device of the A/D converter is provided with a signal generating means for supplying a measuring signal to the A/D converter to be tested; a statistical processing means for arithmetically processing a digital code outputted in synchronization with a first clock signal in the synchronous mode with the first clock signal by the A/D converter to be tested to which the measuring signal is inputted, and performs counting of a statistical value concerning to the generation of each digital code; a memory which records the statistical value in synchronization with the first clock; and an operation means which performs prescribed arithmetic processing using a statistical value of each digital code recorded in the memory and a cumulative value of the statistical values, and outputs a non-linear error. COPYRIGHT: (C)2006,JPO&NCIPI
|
