TEST DATA COMPRESSION AND DECOMPRESSION METHOD USING ZERO-DETECTED RUN-LENGTH CODE (ZDR) IN SYSTEM-ON-CHIP,申请号KR20040044279-传众专利搜索

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发明名称	TEST DATA COMPRESSION AND DECOMPRESSION METHOD USING ZERO-DETECTED RUN-LENGTH CODE (ZDR) IN SYSTEM-ON-CHIP
摘要
申请公布号	KR20050119233(A)	申请公布日期	2005.12.21
申请号	KR20040044279	申请日期	2004.06.16
申请人	YONSEI UNIVERSITY	发明人	KANG, SUNG HO;LEE, YONG
分类号	G01R31/3183	主分类号	G01R31/3183
代理机构		代理人
主权项
地址

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