发明名称 |
Generating array bit-fail maps without a tester using on-chip trace arrays |
摘要 |
An existing trace array on a chip is used to store the locations of bit failures from the automatic self-testing of an SRAM array. If a system is having problems, a technician can trigger the automatic test and then scan the trace array, thereby locating a large number of errors on the SRAM array very quickly.
|
申请公布号 |
US6978408(B1) |
申请公布日期 |
2005.12.20 |
申请号 |
US20040008797 |
申请日期 |
2004.12.09 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
HUOTT WILLIAM VINCENT;JAMES NORMAN KARL |
分类号 |
G11C29/00;G11C29/44;(IPC1-7):G11C29/00 |
主分类号 |
G11C29/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|