发明名称 ELECTRON BEAM DETECTOR, ELECTRON BEAM DRAWING METHOD USING THE SAME, AND ELECTRON BEAM DRAWING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an electron beam detector of transmission type which measures the profile of a plurality of electron beams in proximity simultaneously, and an electron beam drawing technology which realizes a high precision drawing using the same. SOLUTION: The electron beam detector comprises a means (103) of transforming the electron beams (101) passed through aperture marks (102) into light (105) and a plurality of light detecting elements (107) corresponding to them, and by scanning the electron beams on the marks, separates (106) the generated light (105), and carries out simultaneous measurement of the profile of a plurality of electron beams. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005347054(A) 申请公布日期 2005.12.15
申请号 JP20040164143 申请日期 2004.06.02
申请人 HITACHI HIGH-TECHNOLOGIES CORP;CANON INC 发明人 OTA HIROYA;KAMIMURA OSAMU;NAKAYAMA YOSHINORI;HAYATA YASUNARI;SOMETA YASUHIRO
分类号 G03F7/20;H01J37/04;H01J37/305;H01L21/027;(IPC1-7):H01J37/04 主分类号 G03F7/20
代理机构 代理人
主权项
地址