发明名称 PROCESSING METHOD IN VAPOR PHASE GROWTH APPARATUS, FORMING METHOD OF THIN FILM AND MANUFACTURING METHOD OF SEMICONDUCTOR APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To stably form a thin film of high quality with sufficient production efficiency by using a vapor phase growth apparatus. <P>SOLUTION: In this method, there is formed a metallic compound film on a wafer by using the vapor phase growth apparatus 100. The forming method of the metallic compound film includes a process for introducing material gas of the metallic compound film including Hf elements or Zr elements into the vapor phase growth apparatus 100 and forming the metallic compound film on the wafer, a process for taking out the wafer where the metallic compound film is formed from the vapor phase growth apparatus 100, a process for introducing reactant gas into the vapor phase growth apparatus 100 and fixing an unreacted organic substance 180 caused from material gas remaining in the vapor phase growth apparatus 100, a process for introducing a different wafer into the vapor phase growth apparatus 100, and a process for introducing the material gas into the vapor phase growth apparatus 100 in a state where the unreacted organic substance 180 is fixed and forming the metallic compound film on the different wafer. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005347447(A) 申请公布日期 2005.12.15
申请号 JP20040164126 申请日期 2004.06.02
申请人 NEC ELECTRONICS CORP 发明人 YAMAMOTO ASAE
分类号 C23C16/44;C23C16/00;C23C16/30;C23C16/40;H01L21/31;H01L21/8242;H01L27/108;H01L29/78 主分类号 C23C16/44
代理机构 代理人
主权项
地址