发明名称 INTERFERENCE FRINGE ANALYSIS METHOD, INTERFERENCE FRINGE ANALYSIS PROGRAM AND INTERFERENCE MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an interference fringe analysis method capable of separating an error generated during fringe scanning surely from interference fringe data. SOLUTION: This method is characterized by including a reference procedure (a) for performing respectively Fourier transform of time characteristics of each brightness on a plurality of points of the interference fringe generated during fringe scanning, and referring to a frequency spectrum of a brightness change on each point; a calculation procedure for performing inverse Fourier transform of a frequency component in a specific range in the frequency spectrum, determining the time characteristic of a specific component of the brightness (b), and determining a change with time of a phase of the specific component based on the time characteristic (c); and an extraction procedure for extracting a component to be measured or a prescribed error component from a space distribution based on the change with time of the space distribution of the phase acquired by executing the calculation procedure relative to each point. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005345246(A) 申请公布日期 2005.12.15
申请号 JP20040164860 申请日期 2004.06.02
申请人 NIKON CORP 发明人 YANAGI SHIKIYO;UDAGAWA SAORI
分类号 G01B9/02;G01M11/00;(IPC1-7):G01M11/00 主分类号 G01B9/02
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