发明名称 |
Substrate for UV-lithography and fabrication process therefor |
摘要 |
Production of a substrate comprises preparing a base layer with a thermal expansion coefficient of not more than 0.1 ppm/K, applying a first covering layer made from a semiconductor material, preferably silicon, on the base layer using a physical or chemical application process, especially by sputtering, CVD or PVD, and post-treating the covering layer. An Independent claim is also included for a substrate produced by the above process. |
申请公布号 |
EP1450182(A3) |
申请公布日期 |
2005.12.14 |
申请号 |
EP20030028774 |
申请日期 |
2003.12.13 |
申请人 |
SCHOTT AG |
发明人 |
ASCHKE, LUTZ;SCHWEIZER, MARKUS;ALKEMPER, JOCHEN;SCHINDLER, AXEL;FROST, FROST;HAENSEL, THOMAS;FECHNER, RENATE |
分类号 |
G21K1/06;B32B9/00;B32B17/06;G02B5/08;G03F1/24;G03F9/00;G21K5/00;H01L21/027;(IPC1-7):G03F1/14 |
主分类号 |
G21K1/06 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|