发明名称 |
Method and apparatus for iddq measuring |
摘要 |
An IDDQ test is applied to an electronic circuit ( 16 ). A power supply unit supplies power supply current to the electronic circuit. The output impedance of the power supply unit is adjusted to a value selected for the electronic circuit, the value having been selected so that a resonance circuit ( 14 ) that comprises a connection between the power supply unit and the electronic circuit is substantially critically dampened. The current sense element ( 18 ) that is used to measure IDDQ current is coupled between an external power supply and a supply input of the power supply unit, so that the current sense element does not affect the output impedance.
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申请公布号 |
US2005270054(A1) |
申请公布日期 |
2005.12.08 |
申请号 |
US20050527380 |
申请日期 |
2005.03.11 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICES N.V. |
发明人 |
VAN HEES JOHANNES LAMBERTUS H. |
分类号 |
G01R31/26;G01R31/30;G01R31/3173;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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