发明名称 EXPOSURE APPARATUS, EXPOSURE METHOD AND EXPOSURE PROCESSING PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To provide an exposure apparatus for improving the yield. <P>SOLUTION: The exposure apparatus which carries out alignment and exposure in the entire region of a substrate or in each region preliminarily segmented is equipped with: a means 36 to judge whether the substrate can be exposed or not based on a substrate mark and a mask mark formed on the substrate and a mask 10 having a pattern to be formed in the substrate, respectively, both marks photographed by a photographing means 20; a memory means 32 to memorize the information about the substrate judged as inappropriate for exposure and the information about a region not exposed which is the region judged as inappropriate for exposure, as error information; and an exposure controlling means 31 which controls to carry out alignment and exposure in the unexposed region based on the error information memorized in the memory means 32 when a substrate having an unexposed region is again introduced after completing the alignment and exposure on a series of substrates in a predetermined number. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005338555(A) 申请公布日期 2005.12.08
申请号 JP20040158939 申请日期 2004.05.28
申请人 ORC MFG CO LTD 发明人 SHINOHARA YUICHI;TABATA HIDETOSHI
分类号 G03F9/00;G03F7/20;H01L21/027 主分类号 G03F9/00
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