发明名称 Fabrication of dielectric on a gate surface to insulate the gate from another element of an integrated circuit
摘要 A gate dielectric ( 150 ) for a gate ( 160 ) is formed by thermal oxidation simultaneously with as a dielectric on a surface of another gate ( 140 ). The dielectric thickness on the other gate is controlled by the dopant concentration in the other gate. The gates may be gates of different MOS transistors, or a select gate and a floating gate of a memory cell. Other features are also provided.
申请公布号 US2005272205(A1) 申请公布日期 2005.12.08
申请号 US20050182875 申请日期 2005.07.14
申请人 发明人 DING YI
分类号 H01L21/768;H01L21/8239;H01L21/8247;H01L27/105;H01L27/115;(IPC1-7):H01L21/336 主分类号 H01L21/768
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