发明名称 FLAW INSPECTION METHOD AND FLAW INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a flaw inspection device of foreign matter or the like capable of separating a flaw such as foreign matter or the like becoming actual harm from the edge roughness or the like of wiring being a non-flaw to detect the same, and a flaw detection method. SOLUTION: The flaw inspection device is constituted by providing beam expanders 201 and 202 for expanding the beam diameter of the coherent laser beam emitted from a laser beam source 100, an optical member group 203 constituted by stacking a plurality of plate-shaped optical members, which are mutually changed in light path length at least in a condensing direction, receiving the laser beam expanded in its beam diameter by the beam expanders to emit a plurality of fine strip-like beams spatially reduced in coherency mutually at least in the condensing direction and a condensing optical system 204 for condensing a plurality of the fine strip-like beams, which are emitted while spatially reduced in coherency mutually from a lens group, in the condensing direction to irradiate the surface of a substrate to be inspected as slit like luminous flux from an inclined direction, as an irradiation optical system 1,000 having the laser beam source 100. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005337851(A) 申请公布日期 2005.12.08
申请号 JP20040156142 申请日期 2004.05.26
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 NAKANO HIROYUKI;NOGUCHI MINORU;OSHIMA YOSHIMASA;UTO YUKIO;HAMAMATSU REI;IWATA HISAFUMI;WATANABE TETSUYA;JINGU TAKAHIRO;FUKUSHIMA HIDEKI
分类号 G01B11/30;G01N21/88;G01N21/89;G01N21/94;G01N21/95;G01N21/956;H01L21/66;(IPC1-7):G01N21/956 主分类号 G01B11/30
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