发明名称 Observation and/or failure inspection apparatus, method and program therefor
摘要 An observation apparatus according to one embodiment can include a timing generating unit ( 2 ) that generates a timing signal at a predetermined period. A sampling unit ( 3 ) can sample a current observation signal of a power supply current on the basis of the timing signal, and store sampled data in data storing unit ( 5 ). A data number adjusting unit ( 6 ) can adjust the number of data samples to a number that is a power of two. An arithmetic operating unit ( 4 ) can Fourier-transform the adjusted data to generate frequency spectrum results of the current observation signal. In addition, a failure inspection apparatus according to one embodiment analyzes the frequency spectrum of an integrated circuit under observation to determine a failure condition of the integrated circuit.
申请公布号 US6973395(B2) 申请公布日期 2005.12.06
申请号 US20030636860 申请日期 2003.08.07
申请人 NEC ELECTRONICS CORPORATION 发明人 YOSHIZAWA YUTAKA;SAKAGUCHI KAZUHIRO
分类号 G01R31/26;G01R23/16;G01R29/26;(IPC1-7):G06F19/00 主分类号 G01R31/26
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