发明名称 |
Observation and/or failure inspection apparatus, method and program therefor |
摘要 |
An observation apparatus according to one embodiment can include a timing generating unit ( 2 ) that generates a timing signal at a predetermined period. A sampling unit ( 3 ) can sample a current observation signal of a power supply current on the basis of the timing signal, and store sampled data in data storing unit ( 5 ). A data number adjusting unit ( 6 ) can adjust the number of data samples to a number that is a power of two. An arithmetic operating unit ( 4 ) can Fourier-transform the adjusted data to generate frequency spectrum results of the current observation signal. In addition, a failure inspection apparatus according to one embodiment analyzes the frequency spectrum of an integrated circuit under observation to determine a failure condition of the integrated circuit.
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申请公布号 |
US6973395(B2) |
申请公布日期 |
2005.12.06 |
申请号 |
US20030636860 |
申请日期 |
2003.08.07 |
申请人 |
NEC ELECTRONICS CORPORATION |
发明人 |
YOSHIZAWA YUTAKA;SAKAGUCHI KAZUHIRO |
分类号 |
G01R31/26;G01R23/16;G01R29/26;(IPC1-7):G06F19/00 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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