| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for evaluating whisker acceleratingly in such a condition as the generation and growth of whisker is not inhibited. SOLUTION: This evaluation method includes leaving electronic parts having a connecting terminal 4 provided with an Sn-plated film of a lead-free plated film, in an inert atmosphere for three hours or longer. The inert atmosphere inhibits an oxide film 14 from forming on the surface of the plated film. The method evaluates the degree of the generation and growth of the whisker 18, by observing it after the whisker 18 has been formed and grown on the Sn-plated film 12 of the connecting terminal 4. COPYRIGHT: (C)2006,JPO&NCIPI
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