发明名称 SELF-DIAGNOSTIC METHOD OF MONITOR
摘要 PROBLEM TO BE SOLVED: To provide a self-diagnostic method of a monitor which incorporates an examination circuit, with regard to a self-diagnostic method of a monitor, with which a monitor can easily examine separate by each portion by an examination circuit built into the monitor. SOLUTION: The self-diagnostic method comprises a video preamplifier and PLL circuit 20; a first signal shaping section 31, which shapes an output signal of a video main amplifier circuit 30 connected to the circuit and feeds the output signal back to the circuit 20; a horizontal oscillation and PLL circuit 50 which compares the horizontal/vertical synchronization signal, inputted from a connector and the horizontal/vertical synchronization signal applied to a CRT to detect a phase difference; a vertical oscillation and PLL circuit 70; second and third signal shaping sections 61, 81 for feeding back to those circuits 50, 70; a fourth signal shaping section 91 which shapes the output voltage of an SMPS 90 for supplying driving power to circuits in respective sections of a monitor; and a microprocessor, which receives the horizontal/vertical synchronization signal from the connector, output gain information and phase difference signals of the circuits 20, 50, 70 and the output voltage of the SMPS via the fourth signal shaping section, discriminates the presence/absence of abnormalities in each circuit and transmits the discriminated data, from the connector to the outside. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005328580(A) 申请公布日期 2005.11.24
申请号 JP20050235349 申请日期 2005.08.15
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 KIM YOUNG-HEE
分类号 H04N17/00;H04N17/04;(IPC1-7):H04N17/04 主分类号 H04N17/00
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