发明名称 GALLIUM OXIDE SINGLE-CRYSTAL COMPLEX, ITS MANUFACTURING METHOD, AND METHOD FOR MANUFACTURING NITRIDE SEMICONDUCTOR FILM USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide gallium oxide single-crystal complex in which mixing of hexagonal based crystal is decreased e.g. when crystal growth of nitride semiconductor is performed, and high-quality cubic crystal can be obtained in which cubic crystal is grown up dominantly to hexagonal based crystal, and which complex can be used as a substrate which is especially suitable for epitaxial growth of cubic crystal GaN, and to provide a method for manufacturing the gallium oxide single-crystal complex and a method for manufacturing a nitride semiconductor film. SOLUTION: In the method for manufacturing gallium oxide single-crystal complex, the gallium oxide single crystal complex has a gallium nitride layer which is composed of cubic gallium nitride (GaN) on the surface of gallium oxide (Ga<SB>2</SB>O<SB>3</SB>) single crystal. By performing nitriding which uses ECR plasma or RF plasma to the surface of the gallium oxide (Ga<SB>2</SB>O<SB>3</SB>) single crystal, the gallium nitride layer composed of the cubic gallium nitride (GaN) is formed on the surface of the gallium oxide single crystal. Furthermore, in the method for manufacturing a nitride semiconductor film, a nitride semiconductor film is grown by using an RF-MBE method on the surface of the gallium oxide single crystal complex. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005327851(A) 申请公布日期 2005.11.24
申请号 JP20040143535 申请日期 2004.05.13
申请人 NIPPON LIGHT METAL CO LTD;RITSUMEIKAN 发明人 OHIRA SHIGEO;NANISHI YASUYUKI;ARAKI TSUTOMU;YAMAGUCHI TOMOHIRO
分类号 C30B29/38;C30B23/02;C30B29/16;C30B29/40;H01L21/20;H01L21/203;H01L21/205;(IPC1-7):H01L21/205 主分类号 C30B29/38
代理机构 代理人
主权项
地址