发明名称 METHOD AND APPARATUS FOR MEASURING SURFACE SHAPE
摘要 PROBLEM TO BE SOLVED: To provide a surface shape measuring method capable of long-range measurement by improving measurement accuracy in two-wavelength phase-shifting interferometry and only slightly improving a conventional phase-shift optical system. SOLUTION: In the surface shape measuring method, an error distribution contained in fringe order computation is estimated in the determination of fringe order of each position in two-wavelength phase-shifting interferometry (Step S21-S24), and the fringe order is determined by subtracting specified errors from the error distribution (Step S25 and S26). As enlarging a measuring range by two-wavelength phase-shifting interferometry, it is therefore possible to reduce the effects of errors due to fringe order errors in its arithmetic processes and maintain original high accuracy in phase-shift interferometry. As a result, it is possible to accurately measure the surface shape of an object to be measured at a long range. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005326249(A) 申请公布日期 2005.11.24
申请号 JP20040144294 申请日期 2004.05.14
申请人 FUJITSU LTD 发明人 NISHIYAMA YOJI;TSUKAHARA HIROYUKI
分类号 G01B9/02;G01B11/24;(IPC1-7):G01B9/02 主分类号 G01B9/02
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