发明名称 SEMICONDUCTOR DEVICE AND PROCESS FOR FABRICATING SAME, AND PROCESS FOR PRODUCING SEMICONDUCTOR SUBSTRATE
摘要 <p>A process for producing a strained SOI substrate having an Si film wherein a tensile strain is induced, a semiconductor device employing the strained SOI substrate and its fabricating process. An SiGe film is grown epitaxially on an si film on a silicon oxide film; surface of the SiGe film is irradiated with a laser beam and heated for a short time; a tensile strain is induced in the Si film as the lattice of the SiGe film relaxes; and then the SiGe film is removed. Since the strained Si film has a high electron mobility and contains no Ge atom in the strained Si film or an underlying film, it has a high quality and operating speed of an n-type MOS transistor employing the strained Si film as a channel layer is enhanced. A p-type MOS transistor of high speed operation and its semiconductor substrate are also disclosed.</p>
申请公布号 WO2005112129(A1) 申请公布日期 2005.11.24
申请号 WO2004JP06447 申请日期 2004.05.13
申请人 FUJITSU LIMITED;MISHIMA, YASUYOSHI 发明人 MISHIMA, YASUYOSHI
分类号 H01L21/20;H01L21/336;H01L21/8238;H01L21/84;H01L27/08;H01L27/088;H01L27/092;H01L27/12;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/20
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