发明名称 |
Method and apparatus for X-ray analysis with a two-dimensional array-detector |
摘要 |
<p>A process for operating an X-ray analysis machine with an X-ray source (17) and a flat two dimensional array detector with pixel elements (7), comprises obtaining a first data set with the object being examined in a particular position relative to the object and detector. The detector is then moved relative to the source and a second data set is obtained. The two data sets are then used to obtain a common data set and the pixels are combined.</p> |
申请公布号 |
EP1598663(A2) |
申请公布日期 |
2005.11.23 |
申请号 |
EP20050009958 |
申请日期 |
2005.05.06 |
申请人 |
BRUKER AXS GMBH |
发明人 |
GERNDT, EKKEHARD, DR.;JACOB, MICHAEL |
分类号 |
G01N23/207;(IPC1-7):G01N23/207 |
主分类号 |
G01N23/207 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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