发明名称 Method and apparatus for X-ray analysis with a two-dimensional array-detector
摘要 <p>A process for operating an X-ray analysis machine with an X-ray source (17) and a flat two dimensional array detector with pixel elements (7), comprises obtaining a first data set with the object being examined in a particular position relative to the object and detector. The detector is then moved relative to the source and a second data set is obtained. The two data sets are then used to obtain a common data set and the pixels are combined.</p>
申请公布号 EP1598663(A2) 申请公布日期 2005.11.23
申请号 EP20050009958 申请日期 2005.05.06
申请人 BRUKER AXS GMBH 发明人 GERNDT, EKKEHARD, DR.;JACOB, MICHAEL
分类号 G01N23/207;(IPC1-7):G01N23/207 主分类号 G01N23/207
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