发明名称 |
Semiconductor integrated circuit device configured to prevent the generation of a reverse current in a MOS transistor |
摘要 |
A semiconductor integrated circuit device has a MOS transistor M 2 including a parasitic diode Dx 2 for preventing a reverse current due to a parasitic diode Dx 1 of a MOS transistor M 1 . The semiconductor integrated circuit device further has a voltage setting circuit 1 for turning the MOS transistor M 2 off in a reversely biased state, and an anti-reverse-current element 2 for preventing a reverse current from flowing through the voltage setting circuit 1 in a reversely biased state. In normal operation, a direct-current voltage within the withstand voltage range of the MOS transistor M 2 is fed to the gate thereof according to the voltage applied to the conductive terminal 6 y of the MOS transistor M 2.
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申请公布号 |
US6967378(B2) |
申请公布日期 |
2005.11.22 |
申请号 |
US20040786296 |
申请日期 |
2004.02.26 |
申请人 |
ROHM CO., LTD. |
发明人 |
NISHIKAWA NOBUHIRO;INOUE KOICHI |
分类号 |
H01L27/04;H01L21/00;H01L21/822;H01L21/8234;H01L23/62;H01L27/00;H01L27/02;H01L27/088;H01L29/76;H02H3/24;H03K17/00;H03K17/10;H03K17/24;H03K19/003;(IPC1-7):H01L23/62 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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