发明名称 Semiconductor memory array of floating gate memory cells with vertical control gate sidewalls and insulation spacers
摘要 A self aligned method of forming a semiconductor memory array of floating gate memory cells in a semiconductor substrate having a plurality of spaced apart isolation regions and active regions on the substrate substantially parallel to one another in the column direction. Floating gates are formed in each of the active regions. Control gates are each formed with a substantially vertical face portion by covering a portion of a conductive layer with a protective layer, and performing an anisotropic etch to remove the exposed portion of the conductive layer. An insulation sidewall spacer is formed against the vertical face portion. The control gates have protruding portions that extend over the floating gates.
申请公布号 US6967372(B2) 申请公布日期 2005.11.22
申请号 US20010916618 申请日期 2001.07.26
申请人 SILICON STORAGE TECHNOLOGY, INC. 发明人 CHERN GEENG-CHUAN
分类号 H01L21/28;H01L21/8247;H01L27/115;H01L29/423;H01L29/788;(IPC1-7):H01L29/788;H01L29/76 主分类号 H01L21/28
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