| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To allow a chip type electronic component 30 to be held parallel to an electronic component measuring jig 10, for measuring the electric characteristics of the electronic component 30, when the electronic component 30 is pressed against the measuring jig 10, measure the electric characteristics of the electronic component 30 accurately without damaging it, and increase the life of an anisotropic electric conductive sheet 20. <P>SOLUTION: The measuring jig 10 has measuring electrodes 12 to 17 on an electronic component measuring surface 21 at positions corresponding to external electrodes 31 of the electronic component 30. The measuring jig 10 is provided with protrusions 18, 19 on the electronic component measuring surface 21 which restrict tilting of the electronic component 30 owing to a deviation of a pressing position, when the electronic component 30 is pressed through the anisotropic electric conductive sheet 20 to measure the electric characteristics of the electronic component 30. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p> |
