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发明名称
APPARATUS AND METHOD FOR DETECTING PARTICLE ON WAFER
摘要
申请公布号
KR100529647(B1)
申请公布日期
2005.11.17
申请号
KR20030046158
申请日期
2003.07.08
申请人
发明人
分类号
H01L21/66;(IPC1-7):H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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