首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE WITH TEST PATTERN
摘要
申请公布号
KR20050106866(A)
申请公布日期
2005.11.11
申请号
KR20040031924
申请日期
2004.05.06
申请人
HYNIX SEMICONDUCTOR INC.
发明人
YOUN, HUN SANG
分类号
H01L23/544;(IPC1-7):H01L23/544
主分类号
H01L23/544
代理机构
代理人
主权项
地址
您可能感兴趣的专利
SAFE ROOM
Optical sight with side focus adjustment
Adjustable firearm stock
Picture framing apparatus for use in a motorized vehicle
Mold-casting structure and improvement method for grounding of the same
TWO-PIECE CABLE TIE SUITABLE FOR USE IN AN AUTOMATED CABLE TIE INSTALLATION TOOL
Upright vacuum cleaner
Self-adhesive washer for a bathtub or shower
Protective garment
Image processing apparatus
Electrostatically oscillated device
Semiconductor device and manufacturing method of the same
Systems and methods for a session initiation protocol (SIP) translator
Supporting extensions to production event message schemes via production database server versioning
Automatic reconnect and reacquisition in a computer investigation system
Historical data based workload allocation
Method and apparatus for administering the operating system of a net-booted environment
System and method of synchronization of internal data cache with wireless device application data repositories
Cognition models for wireless communication systems and method and apparatus for optimal utilization of a radio channel based on cognition model data
System for and method of motion and force synchronization with time delay reduction in multi-user shared virtual environments