发明名称 Method for selection of optical fiber and system for inspection of optical fiber
摘要 An optical fiber inspecting system 1 A comprises a waveform measuring unit 2 for measuring an OTDR waveform for an optical fiber F to be inspected and a waveform evaluating unit 3 for evaluating an anomaly within the optical fiber through a use of the measured waveform. Furthermore, the waveform evaluating unit 3 comprises a calculating part 4 and a detecting part 5. The calculating part 4 calculates the gradient and the amount of change in gradient of the waveform at each time point by means of a gradient calculating section 41 and a gradient change amount calculating section 42. The detecting part 5 determines whether or not the gradient and the amount of change in gradient are within a defined allowable range of gradient and a defined allowable range of amount of change, respectively, by means of a gradient determining section 51 and a gradient change amount determining section 52. This realizes an optical fiber inspecting system, an inspection method and a selecting method, all of which enable to detect reliably an anomaly within an optical fiber through an OTDR waveform.
申请公布号 US2005248751(A1) 申请公布日期 2005.11.10
申请号 US20050184924 申请日期 2005.07.20
申请人 SUMITOMO ELECTRIC INDUSTRIAL CO., LTD. 发明人 ENDO SHINJI;NAGAO YOSHIAKI;YAMAMOTO TOSHIYUKI;OSHIMA TOSHIO
分类号 G01M11/00;G01N21/00;(IPC1-7):G01N21/00 主分类号 G01M11/00
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