发明名称 Semiconductor memory device with ability to adjust impedance of data output driver
摘要 A semiconductor memory device for performing an OCD calibration control operation in order to adjust a data output impedance, including: means for decoding an address signal to generate an OCD default control signal, an OCD operation signal and plural data; means for receiving a plural-bit data to generate an OCD control code; means for receiving the OCD control code and the OCD operation signal to generate a plurality of impedance adjustment control signals; and means for receiving the plural data and adjusting the data output impedance in response to the plurality of impedance adjustment control signals.
申请公布号 US2005248375(A1) 申请公布日期 2005.11.10
申请号 US20040023920 申请日期 2004.12.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG HUN-SAM
分类号 G11C11/407;G06F19/00;G11C7/10;G11C11/40;G11C11/401;G11C11/4076;G11C11/409;G11C11/4093;H03K3/00;(IPC1-7):H03K3/00 主分类号 G11C11/407
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