发明名称 SOI-type semiconductor device, and production method for manufacturing such SOI-type semiconductor device
摘要 In a silicon-on-insulator (SOI)-type semiconductor device, a buried silicon dioxide layer is produced in the silicon substrate. An area of the silicon substrate, which is sited above the buried silicon dioxide layer, is defined as an SOI area, and the remaining area is defined as a non-SOI area. A peripheral edge portion of the buried silicon dioxide layer is formed as a swelling edge portion. A first field-isolation layer is formed at the SOI area along the swelling edge portion of the buried silicon dioxide layer, a second field-isolation layer is formed at the non-SOI area along the swelling edge portion of the buried silicon dioxide layer.
申请公布号 US2005250259(A1) 申请公布日期 2005.11.10
申请号 US20050080502 申请日期 2005.03.16
申请人 NEC ELECTRONICS CORPORATION 发明人 SAKAKIDANI AKIHITO;SUZUKI TAKAYUKI
分类号 H01L21/762;H01L21/02;H01L21/76;H01L21/8234;H01L21/84;H01L27/08;H01L27/088;H01L27/12;H01L29/786;(IPC1-7):H01L21/84 主分类号 H01L21/762
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