发明名称 SHEARING INTERFEROMETER AND INTERFERENCE MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a shearing interferometer or the like capable of measuring the surface shape, eccentricity or the like of an optical element stably and highly accurately regardless of a peripheral environment. SOLUTION: This interferometer has a laser light source 111, a light flux splitting part 115 for splitting a light flux from the laser light source 111 into the first light flux and the second light flux, and an image rotator 116 for rotating the light flux at a prescribed angle relative to an optical axis AX. The interferometer also has a light flux synthesizing part 115 for synthesizing the first light flux and the second light flux rotating at a prescribed angle in the opposite directions respectively, an imaging optical system 118 for imaging the synthesized light fluxes, and a CCD camera 119 for taking an interference fringe. The light flux rotation part 116 allows the first light flux and the second light flux to enter from the opposite directions respectively, and rotates the first light flux and the second light flux at the prescribed angle in the opposite directions respectively, and the function of the light flux splitting part 115 and the function of the light flux synthesizing part 115 are used in common by the same beam splitter 115. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005315683(A) 申请公布日期 2005.11.10
申请号 JP20040132679 申请日期 2004.04.28
申请人 OLYMPUS CORP 发明人 SEKIYAMA KENTARO
分类号 G01B9/02;G01M11/00;(IPC1-7):G01B9/02 主分类号 G01B9/02
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