<p>In a fluorescent X-ray analysis method, a sample (1) is set on a sample stage (2) on an upper side of an X-ray irradiation chamber (7) and a sample cover (6) is closed from the upper part of the sample (1) to surround the sample (1), and then, a lower plane of the sample (1) is irradiated with X-ray for analysis. When the sample (1) is set on the sample stage (2) and the sample cover (6) is closed, a cover detecting means (8) detects that the sample cover (6) is closed and X-ray is automatically projected from an X-ray source (3) to start analysis.</p>
申请公布号
WO2005106439(A1)
申请公布日期
2005.11.10
申请号
WO2005JP07774
申请日期
2005.04.25
申请人
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.;IWAMOTO, HIROSHI;TANI, YOSHIYUKI;HISAZUMI, TAKAO;IWATA, YUKIHIRO;SAKAGUCHI, ETSUYOSHI