发明名称 METHOD FOR ESTIMATING ABNORMALITY OF ELECTRIC DEVICE, AND CONTROLLER
摘要 <P>PROBLEM TO BE SOLVED: To accurately estimate an electric device causing device abnormality. <P>SOLUTION: A CPU counts up the numbers of times of related abnormality occurrence in related electric devices when device abnormality is caused, updates occurrence history information stored in a history memory, and when the occurrence history information reaches an amount by which a related electric device causing the device abnormality can be estimated, estimates related electric devices which can be a cause of the device abnormality from the count values in the numbers of times of related abnormality occurrence and analyzes accuracy (steps 120 to 124). When the number of related electric devices having fixed accuracy is a prescribed number or less, notification priority is set to the estimated related electric devices, a notification method is selected and the related electric devices estimated as causes of the device abnormality are notified by the selected notification method (steps 126 to 136). Consequently defects of electric devices present between the CPU and an end electric device can be accurately decided. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005316719(A) 申请公布日期 2005.11.10
申请号 JP20040133862 申请日期 2004.04.28
申请人 FUJI XEROX CO LTD 发明人 FURUSAWA TSUTOMU
分类号 B41J29/38;B41J29/46;G03G21/00;G06F3/12;H04N1/00 主分类号 B41J29/38
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